J. Hohlbein, U. Rehn, and R. B. Wehrspohn, Physica Status Solidi (a), 204, 803, 2004, [link]
We present a new method to characterize in-situ the optical thickness of porous alumina films by the use of photoluminescence-induced Fabry-Perot-interferences. Additionally we show, that the use of different electrolytes yields different photoluminescence pattern. A second experiment allows to determine the degree of filling of the pores by a liquid which is of importance when using the pores as templates.